OF59 Stabilization of Pd sintering on La-stabilized gamma-alumina

Thursday, June 9, 2011: 1:50 PM
Ambassador Ballroom 3 (Detroit Marriott Hotel at the Renaissance Center )
Eric J. Peterson1, Andrew DeLaRiva1, Barr Halevi1, Boris Kiefer1, Abhaya K. Datye2 and Lawrence F. Allard3, (1)Center for Micro-Engineered Materials, University of New Mexico, Albuquerque, NM, (2)Chemical & Nuclear Engineering and Center For Microengineered Materials, University of New Mexico, Albuquerque, NM, (3)Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
The development of aberration-corrected electron microscopy (ACEM) has provided new insights regarding sub-nanometer size regimes. Our EXAFS study of Pd loaded onto La-stabilized gamma-alumina, coupled with ACEM, describes single-atoms and several-atom clusters present on the gamma-alumina surface.

Extended Abstracts:

See more of: Novel In-Situ Characterization Techniques (II)
See more of: Emerging Issues: Novel Materials, Theory, and Experimental Methods
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