Development of Quantitative STEM for a Conventional S/TEM: Atom Counting in Metallic Nanoparticles

House, Stephen

Monday, June 15, 2015

Ballroom B (Lawrence Convention Center)

Stephen House¹, Long Li^1,2, Cecile Bonifacio¹, Matthew France¹, Dong Su³, Eric Stach³ and Judith Yang¹, (1)University of Pittsburgh, USA, (2)RJ Lee Group Inc., USA, (3)Brookhaven National Laboratory, USA.

We have developed a Quantitative STEM (QSTEM) technique for a conventional non-aberration-corrected JEOL 2100F S/TEM with no special attachments or modifications required. This allows for the accurate counting of atoms in nanoparticle catalysts for the determination of particle shape and size from a single image.

Extended Abstracts:

NAM24_Abstract.pdf (793.4KB) - Extended Abstract

P-Mo-B-188 Development of Quantitative STEM for a Conventional S/TEM: Atom Counting in Metallic Nanoparticles