O-Tu-408-4 Illuminating Surface Atoms in Nanoclusters By Differential X-Ray Absorption Spectroscopy

Tuesday, June 16, 2015: 10:40 AM
408-410 (Lawrence Convention Center)
Charles Spanjers and Robert Rioux, Pennsylvania State University, USA.
Differential EXAFS (Δ-EXAFS) data were obtained from SiO2-supported Pd NCs  by measuring the EXAFS signals before and after Ar adsorption, and modeled by taking into account only un-subtracted, surface Pd contributions.  The increased sensitivity of Δ-EXAFS allows for detection of small changes in the coordination environment of surface Pd atoms.

Extended Abstracts:

See more of: Spectroscopic Characterization of Catalysts
See more of: Catalyst Characterization
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