Abstract: New Possibilities in High-sensitivity Low-energy Ion Scattering (LEIS) for Probing the Outermost Atomic Layer (21st National Annual Meeting (June 7-12, 2009))

Tuesday, June 9, 2009

Pacific Concourse (Hyatt Regency San Francisco)

Thomas Grehl , ION-TOF GmbH, Muenster, Germany

Ewald Niehuis , ION-TOF GmbH, Muenster, Germany

Rik ter Veen , Tascon GmbH, Muenster, Germany

Hidde H. Brongersma , Tascon GmbH/ION-TOF GmbH, Muenster, Germany

Nathan Havercroft , ION-TOF GmbH, Muenster, Germany

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P-T-71 New Possibilities in High-sensitivity Low-energy Ion Scattering (LEIS) for Probing the Outermost Atomic Layer